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Jim Powell, Applications Engineer/Technical Trainer, Rudolph Technologies

Jim Powell has worked in probe card analysis for 17 years. He joined Applied Precision in 2000, as a Field Service Engineer, installing and maintaining probe card, and wafer analysis equipment. In 2007 Rudolph Technologies acquired Applied Precision, where Jim continued to work as a technical trainer and applications engineer expanding in to wafer inspection technologies as well as probe card analysis. In this role, Jim continues provides support and solutions to the probe card and wafer inspection community. Expertize in:  PrecisionPoint, ProbeWoRx, WaferWoRx, PrecisionWoRx, NSX/F30, Discover software and AWX systems.

Probe Card Metrology, Challenges and Solutions

The increasing complexity of advanced probe card solutions conspires to have probe card investment outweigh nearly any other investment in the logic probe test cell, today. Probe cards necessary to support the testing in high parallelism of Applications Processors and Graphics or Micro- Processors, today, are frequently representing a meaningful fraction of the cost of the underlying test system. Ensuring the proper build/manufacture of these cards requires probe card metrology capable of substantially emulating that test system. But, more to the point, ensuring on-going performance and extending the useful life of these cards demands that users increasing invest in probe card metrology that is similarly capable. This paper will explore the attributes of “probe card metrology solutions” to include the probe card metrology and probe card interface (or motherboard) necessary to insure the goodness of the probe test cell in manufacturing.