Daniel Bock, Customer Applications and Production Solutions (CAPS) Group, FormFactor
Daniel Bock received his Ph.D. in Physics at Carnegie Mellon University in 2006, working on Superconducting Nanowire Bolometers in the NanoFabrication Lab. He then went to work in 2007 with Physical Optics Corporation in Torrance, CA. There, he was awarded more than $4M in SBIR research grants from the Department of Defense, developing innovative high-power tunable filters for use in Electronics Warfare and Electronics Attack systems. Since he joined Cascade Microtech in June of 2012, he has been working to extend the mmWave bandwidth of Pyramid Probe® technology, including RF test of automotive radar devices. He has also led the development of the Custom Calibration Substrate (Custom ISS) product line to supplement the standard ISS line.
RF Massive Parallelism
New applications using Radio Frequency (RF) chips are driving the total number of RF lines to numbers not seen in previous generations. Historically, RF devices typically had one or two lines for transmit and a similar number for receiving. Because of the higher data rate requirements and higher operating frequencies, new applications with phased antenna arrays, such as 5G applications or SW defined radios, have pushed the number of lines up into the 20’s or 30’s for a single device. Add the ongoing push for more parallelism in testing and engineers will soon be grappling to support probe cards with well over 100 RF lines. This session will consider the market drivers that are behind this trend, including the new requirements that it places on testing and the potential solutions available to enable this next generation of RF devices discussing channel count, isolation and RF calibration considerations.