compass-logo-2017

HALF MOON BAY, CA - OCTOBER 18-20, 2017

DRIVING TEST PRECISION INTO VOLUME

Ralf Herrtwich

DAY 1 KEYNOTE

Ralf Herrtwich

Head of Automotive Business Group, HERE

 

DAY 2 KEYNOTE

Octavio Martinez

Vice President of Engineering, Qualcomm

 

"Maps for Cars by Cars"

When an out-of-date map is usually merely a nuisance to the human driver when getting inaccurate navigation instructions, it may constitute a more severe issue for automated vehicles. For them, the map needs to be not only more detailed, but also more accurate and up-to-date.

ATTEND COMPASS 2017

DRIVING TEST PRECISION INTO VOLUME

During two full days of technical presentations, you will learn emerging test challenges, best practices and latest test and measurement technologies in a wide variety of advanced applications, including (but not limited to) :

  • Test challenges of automotive devices
  • 5G technology development
  • High-voltage and high-current device test
  • Test and calibration techniques at RF/mmW frequencies
  • PTPA error analysis and over-temperature measurements
  • Measurements up to 500 GHz and beyond
  • Small pad probing
  • Wafer- and/or package-level reliability test
  • Tips, techniques and utilities for dealing with challenging probing situations
  • Silicon photonics, HB-LED production test

 

EARLY-BIRD REGISTRATION* $200 USD

GROUP DISCOUNT OF 3 OR MORE $200 USD

WHAT'S INCLUDED:

  • Two full days of technical sessions
  • Networking opportunities throughout the conference
  • PDF versions of all presentations
  • Sponsor exhibition
  • Breakfast/lunch/dinner

* Standard registration $250 after August 25, 2017

PROGRAM SCHEDULE*

Wednesday, October 18
18:00-20:00 Welcome Reception
Thursday, October 19
08:00-08:30 Registration/ Networking Breakfast/ Sponsor Expo
08:30-08:50 Welcome and Day 1 Agenda Review
08:50-09:40 Keynote Address: Maps for Cars by Cars (Ralf Herrtwich, Head of Automotive Business Group, HERE, Inc.)
09:40-10:00 Networking Break and Sponsor Expo
Track A: Advanced Testing Track B: Photonics/Optoelectronics
10:00-10:35 Magnetic Probe Cards – Hall Sensors and More (Rainer Gaggl, T.I.P.S) Test Challenges in AIM Photonics Multi-Project Wafer Offering (Robert Polster, Columbia University)
10:40-11:15 Measurement Uncertainties Due to Hitherto Unspecified Offsets between Source Measurement Units (Sebastian Koch, Infineon) An Approach for Wafer-Level Optical Polarization Resolved Spectral Measurements (Karl Merkel, Keysight Technologies)
11:20-11:55 TBA Test Station for Flexible Semi-Automatic Wafer-Level Silicon Photonics Testing (Author: Jeroen De Coster, imec. Presenter: Bryan Bolt, FormFactor)
11:55-13:00 Roundtable Lunch
Track C: RF/mmW Probing Track D: Reliability/Parametric
13:00-13:35 Multi-Port Millimeter-Wave Production Test Cell (Devin Morris, Roos Instruments) Accelerated Life Testing for Reliability Wearout Mechanisms in 180 nm CMOS Technology (Shammi Verma, Semi-Conductor Laboratory)
13:40-14:15 RF Massive Parallelism (Daniel Bock, FormFactor) Enhanced Lifetime of Copper Interconnect Lines due to Stress Relaxation During Intermittent Current Studies (Jennifer Passage, SUNY Polytechnic Institute)
14:15-14:30 Networking Break + Sponsor Expo
14:30-15:05 Investigation of Parasitic Modes By 3D Full-Wave Electromagnetic Simulations including RF Probe Tips (Florian Boes, Karlsruhe Institute of Technology) Modeling and Minimizing Stray Capacitance for Parametric Probe Cards (Larry Levy, FormFactor)
15:10-15:45 Minimizing Discontinuities in Wafer-Level Sub-THz Measurements up to 750 GHz for Device Modelling Applications (Choon Beng Sia, FormFactor) Overcoming Challenges of Unattended Over-Temperature Wafer-Level Measurements (Chai Kheh Aun, X-FAB)
17:00-20:00 Offsite Event and Dinner
Friday, October 20
08:00-08:30 Registration/ Networking Breakfast/ Sponsor Expo
08:30-08:50 Day 2 Agenda Preview
08:50-09:40 Featured Session: Probing and Testing Challenges in The 5G Era (Octavio Martinez,  Vice President of Engineering, Qualcomm)
09:40-10:00 Networking Break + Sponsor Expo
Track E: Production Test Track F: Power Devices
10:00-10:35 The CM300, MHU300 and PDC50 in The Wafer Fab (Bart De Wachter, imec) Role of Wide Bandgap Semiconductors in Next-Generation Power Converters (Srabanti Chowdhury, University of California, Davis)
10:40-11:15 High-Parallelism Probe Card on V93000 Direct Dock System to Increase Testing Throughput on Automotive IC (Alan Liao, FormFactor) Forget the Paschen and Embrace Turbulence! (Adam Schultz, Celadon Systems)
11:20-11:55 A New Technology for Testing High-Speed RF Applications (Texas Instruments and FormFactor) TBA
12:05-12:45 Lunch / Sponsor Expo
12:45-13:15 Hands-On Workshop Sessions

Topics/Speakers TBA

13:20-13:50
13:55-14:25
14:30-15:00
15:30-16:30 Happy Hour/ Networking Reception

* Preliminary program is subject to change

TRAVEL

BOOK YOUR ROOM AT OCEANO HOTEL BY SEPT.22

Oceano Hotel & Spa Half Moon Bay Harbor

280 Capistrano Road, Half Moon Bay, CA 94019

http://www.oceanohalfmoonbay.com/ | (650) 726-5400

How to Book Your Room with COMPASS Group Rate ($219 + tax):

Please send your name and your arrival and departure dates to compass@cmicro.com by September 22. 

Once you have provided your arrival and departure date, you will receive an email within 1 business day confirming receipt of your reservation request. A reservation will be made and confirmation number sent to you prior to the conference date.

For questions or further assistance, please email compass@cmicro.com.

hotel-logo

COMPASS 2016 SPONSORS

FormFactor, Inc.
Cascade Microtech
celadon-logo
gore-logo
keysight-logo
maury-microwave-logo
vdi-logo