October 17-18, 2016  – Portland, Oregon

Conquering Tomorrow’s Test Challenges

Mike Murray


Michael Murray

General Manager, Industrial Sensing Division
Analog Devices

“Capex to Opex Economics within the Internet of Things”

We are approaching an exciting time of autonomy, ubiquitous connectivity and deep learning about the people and the things within an environment.

Michael Hochberg


Michael Hochberg

Director of Research and Development
Coriant Advanced Technology

“Test Challenges for Integrated Optics”

Integrated optics, and in particular silicon photonics, poses unique test challenges. As the industry moves toward building large-scale integrated photonic devices, a very rapid evolution of the relevant test platforms is going to be required.


Conquering Tomorrow’s Test Challenges

Learn, share and collaborate with scientists, engineers and test floor managers on the cutting edge of test and measurement.

During two full days of presentations and demos you will learn how to:

  • RF/mmW measurement and calibration methodology
  • Measurements up to 500 GHz and beyond
  • High-voltage and high-current on-wafer device characterization
  • Over-temperature measurements
  • Small pad probing
  • Wafer- and/or package-level reliability test
  • Tips, techniques and utilities for dealing with challenging probing situations
  • Cryogenic probing
  • Silicon photonics
  • PTPA error analysis

Who Attends:

R&D engineers, test floor managers, researchers and design engineers




What’s Included:

  • Access to all technical sessions and presentations during the event
  • Access to all presentations following the event
  • More to be announced

* Standard registration $250 after August 19, 2016.


Includes: Justification Letter, Budget Worksheet as well as last year's Executive Summary and Program/Agenda.

Download cta-no-subtitle



Sunday, October 16

18:00 Welcome Reception

Monday, October 17

8:00 Registration and Networking Breakfast
8:30 Welcome and Opening
9:00 Keynote: Capex to Opex Economics within the Internet of Things (Analog Devices)
Track A: Power Track B: Calibration
10:15 High Voltage, High Current – and Some Like it Hot Too… (T.I.P.S) Near and Far Field E and H in Sub-mm-Wave On-wafer Probes (Portland State University)
10:55 Unique Approach to Characterizing Power Devices at 3 kV Over Temperature (Celadon Systems) A Method for On-wafer Calibration of Power and Impedance (Keysight Technologies)
11:35 Advancing the Frontiers in Automatized On-wafer Testing of Power Semiconductors (ON Semiconductor) Comparison of Calibration Processes with a Precise On-wafer Measurement System in NMIJ (AIST)
12:10 “Birds of a Feather” Roundtable Lunch
Track C: Production Test Track D: RF/mmW Probing
13:10 Production-level On-wafer Probe of Multi-channel 77 GHz Radar Transceiver Chipset (NXP Semiconductors) Optimizing On-wafer THz and Differential Measurement Accuracy with High Directivity (VDI)
13:50 Verification of High-Bandwidth-Memory (HBM) Through Direct Probing on MicroBumps (FormFactor) Optimize PCB Pad Design for mmW Measurements (Graz University of Technology)
14:30 Production Millimeter-Wave Test Cell for Automotive Radar SoCs (Roos Instruments) High-Speed and Wideband On-wafer Load Pull for Model Extraction, Validation and Design (Maury Microwave)
15:10 Achieving Higher Speeds for CMOS Image Sensor Testing (FormFactor) Investigation of Line Length Effects in Multiline TRL Calibrations at 1.1 THz (DMPI)
17:30 Off-site Event Followed by Networking Dinner

Tuesday, October 18

8:00 Networking Breakfast
8:30 Day 2 Agenda Preview
8:40 Featured Session: Test Challenges for Integrated Optics (Coriant)
Track E: Advanced Testing Challenges Track F: Optoelectroncis/Photonics
10:00 Advanced Measurement and Processing Capability within WinCal XE (Cascade Microtech) An Approach to Wafer-level Characterization of a Planar Opto-electronic BiCMOS Technology (IHP)
10:40 Applications and Measurement Considerations on Low-frequency Noise Analysis (Keysight Technologies) Out of the Lab and into the Fab: Optical Probing as an Enabler for Silicon Photonics’ Next Chapter (Physik Instrumente)
11:20 Challenges in PLR Testing for EM, SM and HCI (X-FAB Semiconductor) TBD
13:30 Interactive Equipment Demo at Cascade Microtech Office

  • 2-port measurement and calibration at 110 GHz
  • Multi-site wafer-level reliability test
  • Measurement automation and PTPA
  • Silicon photonics probing
  • Parametric probe card for automotive radar and SoCs
16:00 Networking Reception


*Program and Agenda are subject to change.

Download Program cta-no-subtitle

COMPASS 2016 Sponsors


COMPASS 2016 will be held at the Hilton Portland & Executive Tower in Portland, OR.


Guest rooms at the special group rate (Single $179+ taxes/fees) are available from October 17th – October 18th*

For reservations at our group rate, please call the Hilton Portland & Executive Tower (+1-503-226-1611) by September 21, 2016 and mention Cascade Microtech COMPASS 2016

*Reservations for other dates are being accepted at the prevailing rate

Hilton Portland & Executive Tower

921 SW 6th Avenue, Portland, OR 97204

Need more information? Email us or use the tag #COMPASS16