General Manager, Industrial Sensing Division
“Capex to Opex Economics within the Internet of Things”
We are approaching an exciting time of autonomy, ubiquitous connectivity and deep learning about the people and the things within an environment.
Director of Research and Development
Coriant Advanced Technology
“Test Challenges for Integrated Optics”
Integrated optics, and in particular silicon photonics, poses unique test challenges. As the industry moves toward building large-scale integrated photonic devices, a very rapid evolution of the relevant test platforms is going to be required.
Learn, share and collaborate with scientists, engineers and test floor managers on the cutting edge of test and measurement.
During two full days of presentations and demos you will learn how to:
R&D engineers, test floor managers, researchers and design engineers
* Standard registration $250 after August 19, 2016.
Includes: Justification Letter, Budget Worksheet as well as last year's Executive Summary and Program/Agenda.
Sunday, October 16
Monday, October 17
|8:00||Registration and Networking Breakfast|
|8:30||Welcome and Opening|
|9:00||Keynote: Capex to Opex Economics within the Internet of Things (Analog Devices)|
|Track A: Power||Track B: Calibration|
|10:15||High Voltage, High Current – and Some Like it Hot Too… (T.I.P.S)||Near and Far Field E and H in Sub-mm-Wave On-wafer Probes (Portland State University)|
|10:55||Unique Approach to Characterizing Power Devices at 3 kV Over Temperature (Celadon Systems)||A Method for On-wafer Calibration of Power and Impedance (Keysight Technologies)|
|11:35||Advancing the Frontiers in Automatized On-wafer Testing of Power Semiconductors (ON Semiconductor)||Comparison of Calibration Processes with a Precise On-wafer Measurement System in NMIJ (AIST)|
|12:10||“Birds of a Feather” Roundtable Lunch|
|Track C: Production Test||Track D: RF/mmW Probing|
|13:10||Production-level On-wafer Probe of Multi-channel 77 GHz Radar Transceiver Chipset (NXP Semiconductors)||Optimizing On-wafer THz and Differential Measurement Accuracy with High Directivity (VDI)|
|13:50||Verification of High-Bandwidth-Memory (HBM) Through Direct Probing on MicroBumps (FormFactor)||Optimize PCB Pad Design for mmW Measurements (Graz University of Technology)|
|14:30||Production Millimeter-Wave Test Cell for Automotive Radar SoCs (Roos Instruments)||High-Speed and Wideband On-wafer Load Pull for Model Extraction, Validation and Design (Maury Microwave)|
|15:10||Achieving Higher Speeds for CMOS Image Sensor Testing (FormFactor)||Investigation of Line Length Effects in Multiline TRL Calibrations at 1.1 THz (DMPI)|
|17:30||Off-site Event Followed by Networking Dinner|
Tuesday, October 18
|8:30||Day 2 Agenda Preview|
|8:40||Featured Session: Test Challenges for Integrated Optics (Coriant)|
|Track E: Advanced Testing Challenges||Track F: Optoelectroncis/Photonics|
|10:00||Advanced Measurement and Processing Capability within WinCal XE (Cascade Microtech)||An Approach to Wafer-level Characterization of a Planar Opto-electronic BiCMOS Technology (IHP)|
|10:40||Applications and Measurement Considerations on Low-frequency Noise Analysis (Keysight Technologies)||Out of the Lab and into the Fab: Optical Probing as an Enabler for Silicon Photonics’ Next Chapter (Physik Instrumente)|
|11:20||Challenges in PLR Testing for EM, SM and HCI (X-FAB Semiconductor)||Facing Challenges When Parallel Testing Double-sided Colorimeter Sensors (Maxim Integrated)|
|13:30||Interactive Equipment Demo at Cascade Microtech Office
*Program and Agenda are subject to change.
Guest rooms at the special group rate (Single $179+ taxes/fees) are available from October 17th – October 18th*
For reservations at our group rate, please call the Hilton Portland & Executive Tower (+1-503-226-1611) by September 21, 2016 and mention Cascade Microtech COMPASS 2016
*Reservations for other dates are being accepted at the prevailing rate
921 SW 6th Avenue, Portland, OR 97204